Ensaios acelerados em lâmpadas fluorescentes compactas

Abstract

Accelerated life testing is a methodology that has been applied to estimate the lifetime of the components produced in the industry , in order to reduce the cost of premature maintenance raising equipment availability rate, increasing the credibility and competitiveness. This article proposes to apply in practice the accelerated testing technique using as test component electronic lamps , simulating the behavior of systems where these components are inserted and apply on them controlled loads and stresses to estimate the average lifetime under normal conditions of use. To increase the data reliability that will be collected an automatic electronic didactic bench will be developed , it will simulate the component's operation and identify the exact time of the crash reducing measurement errors during the trial period. Data collection was successful, the bench and the environment simulation device played its function as designed some improvements were identified during the data collection process, as the result of the analysis, this suffered interference outliers suggest improvements in the data collection process in order to minimize these impacts in future trials and improve the outcome of the experiment.